Electrical systems

1924 De Broglie wave theory: electrons can move as particles or waves

1930 Knoll and Ruska first electromagnetic lens

Shape of source
Types

LENSES

Electrons entering a magnetic field in a lens are deflected in direction but there is no change in velocity.

wrap wire around tube, get magnetic field inside, strongest along sides, weakest in the middle. Electrons entering the field are delected perpendicular and end up spiraling down the tube (Fig. 2.8).

To increase lens power:

1. more wire wraps

2. more metal in casings

pole pieces to concentrate field into smaller area
3. more current


Lens aberrations

Astigmatism: non symmetrical lens--Circles look like ovals
Correction: add equal and opposite distortion from additional lenses, called stigmator coils. These are arranged around the lens in 2 sets of coils
Chromatic aberration: different wavelengths focus at different distances
Correction:
1) Stabilize electron source

2) Increase lens current

3) Use thinner sections in TEM since specimen interactions slow electrons down variably

Spherical aberration: electrons at edge don't focus at same spot as electrons in center
Correction:
1) Increase lens current

2) Use aperture to prevent electrons from contributing to image


Aperatures: Metal disks with a center hole (Fig. 2.9)

1. Apertures limit the outer edge of lenses (can correct spherical aberration).

2. Reduce the amount of illumination on sample.

3. Increase contrast by removing inelastically-scattered electrons (IN TEM)

4. Effect the depth of field

Column Configurations--TEM (Fig. 4.6)
  1. condensers: focuses beam to a large spot
  2. objective lens: forms image -------this is the primary image former (0-100x)
    1. must place specimen close to or in lens for minimum focal length for best imaging

    2. will cause asigmatism by cutting a hole in the magnet
  3. intermediate lens: primary magnifier (variable, 100-200x)
  4. projector lens: secondary magnfier (only about 300x)forms final real image

  5. Column Configurations--SEM (Fig. 5.3)

  6. condensers: focuses beam to small spot
    1. relatively weak with focal length of several cm

    2. may or may not have pole pieces
  7. objective lens==focuses small spot onto sample
    1. scan coils in lens cause beam to move in grid pattern over sample
  • Reflected electrons are counted a spot at a time by the detector and sent to a viewscreen as an intensity.

  • All the spots taken together form the image.
    Image formation, magnification, and column configuration
    TEM --lenses focus image on viewing screen
    --lenses magnify image in floodbeam formed at sample and project on viewscreen within microscope column
    SEM --lenses focus illumination spot on sample surface, image subsequently formed on view CRT outside column